probe voltage

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• voltage probe — voltmetro liestukas statusas T sritis radioelektronika atitikmenys: angl. voltage probe; voltage prod vok. Spannungsmeßspitze, f rus. щуп вольтметра, m pranc. sonde de voltmètre, f …   Radioelektronikos terminų žodynas

• voltage prod — voltmetro liestukas statusas T sritis radioelektronika atitikmenys: angl. voltage probe; voltage prod vok. Spannungsmeßspitze, f rus. щуп вольтметра, m pranc. sonde de voltmètre, f …   Radioelektronikos terminų žodynas

• Test probe — Typical passive oscilloscope probe being used for testing an integrated circuit. A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to the device under test (DUT). They range from… …   Wikipedia

• Langmuir probe — A Langmuir probe is a device named after Nobel Prize winning physicist Irving Langmuir, used to determine the electron temperature, electron density, and electric potential of a plasma. It works by inserting one or more electrodes into a plasma,… …   Wikipedia

• Mercury probe — The Mercury Probe is an electrical probing device to make rapid, non destructive contact to a sample for electrical characterization. Its primary application is semiconductor measurements where time consuming metallizations or photolithographic… …   Wikipedia

• Scanning voltage microscopy — (SVM) sometimes also called nanopotentiometry is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or… …   Wikipedia

• Kelvin probe force microscope — Kelvin probe force microscopy ( KPFM ), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM) that was [http://dns.ntu ccms.ntu.edu.tw/references/APPL PHYS LETT 58 2921 1991.pdf invented] in 1991.… …   Wikipedia

• Scanning probe microscopy — Part of a series of articles on Nanotechnology …   Wikipedia

• Huygens probe — Infobox Spacecraft Name = Huygens probe Caption = A scale replica of the probe, 1.3 metres across. Organization = ESA/ASI/NASA Major Contractors = Aérospatiale, now Thales Alenia Space Mission Type = Lander Satellite Of = Saturn Launch = December …   Wikipedia

• Atom probe — The atom probe is an atomic resolution microscope used in materials science that was invented in 1967 by Erwin Müller, J. A. Panitz, and S. Brooks McLane [cite journal|last=Müller|first=Erwin W.|authorlink=Erwin Müller|coauthors=John A. Panitz, S …   Wikipedia

• Hall probe — A Hall probe is a semiconductor based detector which uses the Hall effect to allow the strength of a magnetic field to be measured.The Hall Probe is a device that is used to measure magnetic field. It contains an indium compound crystal mounted… …   Wikipedia